Facet reflectivity of waveguides buried at realistic depths

Ana Vukovic; Phillip Sewell; Trevor Mark Benson; P. C. Kendall

doi:10.1117/12.343719

26 March 1999 Facet reflectivity of waveguides buried at realistic depths

Ana Vukovic, Phillip Sewell, Trevor Mark Benson, P. C. Kendall

Proceedings Volume 3620, Integrated Optics Devices III; (1999) https://doi.org/10.1117/12.343719
Event: Optoelectronics '99 - Integrated Optoelectronic Devices, 1999, San Jose, CA, United States

Abstract

A novel method is applied to the facet reflectivity of a two dimensional waveguides not deeply buried into the cladding. The reflectivity of an angled two dimensional waveguide, with and without antireflection coatings is studied. It is shown that waveguides with AR coatings are more prone to the presence of the semiconductor-air boundary in which case the buried depth has to be taken into account.

Citation Download Citation

Ana Vukovic, Phillip Sewell, Trevor Mark Benson, and P. C. Kendall "Facet reflectivity of waveguides buried at realistic depths", Proc. SPIE 3620, Integrated Optics Devices III, (26 March 1999); https://doi.org/10.1117/12.343719

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