New approach: intelligent digitization with AutoScan

Bertram Kaupert; Andreas Betsche; Hans Steinbichler

doi:10.1117/12.364242

21 September 1999 New approach: intelligent digitization with AutoScan

Bertram Kaupert, Andreas Betsche, Hans Steinbichler

Proceedings Volume 3824, Optical Measurement Systems for Industrial Inspection; (1999) https://doi.org/10.1117/12.364242
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany

Abstract

With optical sensors (mostly working with CCD-cameras), digitizing time could be successfully reduced within the last few years. The result is a dense point cloud which can be used for surface reconstruction, milling, tool manufacturing, etc. The challenge was to further reduce the processing time significantly by an intelligent digitization method which makes enhanced surface generation easier. Now, this great leap forward has been approached with the AutoScan system from Steinbichler Optotechnik adapted to Zeiss measuring machines. In a first step, a new laser scanner captures character lines, edges and borders automatically. The current measurement result is used to control the measuring machine by a computer. Mathematical edges are calculated on-line. Furthermore, also tapes can be digitized automatically. After that, the areas between character lines and borders can be scanned. The sensor system is able to work with 3- or 5-axes machines. A 6^th axis is used for the automatic adjustment of the sensor parallely to character lines or borders. The system's accuracy is better than 30 micrometers, its sample frequency is 32 kHz, and the sensor scans with a frequency of 40 Hz and a speed of up to 2.0 m/min. It is possible to replace the sensor by a touch probe without further calibration. An automatic operating process which does not require user interaction has already been realized.

Citation Download Citation

Bertram Kaupert, Andreas Betsche, and Hans Steinbichler "New approach: intelligent digitization with AutoScan", Proc. SPIE 3824, Optical Measurement Systems for Industrial Inspection, (21 September 1999); https://doi.org/10.1117/12.364242

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KEYWORDS

Sensors

Optical sensors

Laser scanners

Polonium

Computer aided design

Manufacturing

Measurement devices

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