Paper
9 November 1999 Optical limiting properties of neutral nickel dithiolenes
Wei Lian Tan, Wei Ji, Jing Lin Zuo, Jun Feng Bai, Xiao Zeng You, Jin Hong Lim, Sidney S. Yang, David J. Hagan, Eric W. Van Stryland
Author Affiliations +
Abstract
Wide applications of lasers have stimulated a great interest in development of optical limiting devices. These devices can be used to protect optical sensor form laser-induced damage because their transmission is high when they are exposed to low-power laser light, and their transmission becomes low when irradiated by intense laser beams. Here we report such a device based on nonlinear optical effects in two neutral nickel complexes with multi-sulfur 1,2 dithiolene ligands, 1 and 2. The limiting device consisted of a focusing setup and a 1-mm-thick cell, which contained a benzene solution of one of the complexes. THe limiting properties were investigated by both nanosecond and picosecond laser pulses. At 532 nm, the limiting thresholds of complexes 1 and 2 measured by the picosecond laser pulses. At 532 nm, the limiting threshold of complexes 1 and 2 measured by the picosecond laser pluses with a focusing geometry were determined to be approximately 0.3 J/cm2. The linear absorption spectra of the to complexes also indicated that their limiting response should cover the visible and near-IR region. All these result show their limiting performance is superior to the limiting effecting C60. Picosecond time-resolved pump-probe and Z-scan experiments revealed that the observed limiting effects should originate from excited-state absorption and refraction.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Lian Tan, Wei Ji, Jing Lin Zuo, Jun Feng Bai, Xiao Zeng You, Jin Hong Lim, Sidney S. Yang, David J. Hagan, and Eric W. Van Stryland "Optical limiting properties of neutral nickel dithiolenes", Proc. SPIE 3899, Photonics Technology into the 21st Century: Semiconductors, Microstructures, and Nanostructures, (9 November 1999); https://doi.org/10.1117/12.369436
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KEYWORDS
Picosecond phenomena

Absorption

Nickel

Transmittance

Optical limiting

Refraction

Data modeling

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