New type of low-loss SiO2 Y-branch waveguide

Baoxue Chen; Yifang Yuan; Mamoru Iso

doi:10.1117/12.408325

29 November 2000 New type of low-loss SiO₂ Y-branch waveguide

Baoxue Chen, Yifang Yuan, Mamoru Iso

Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408325
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China

Abstract

A novel Y-branch waveguide structure, in which a transitional guide is embedded between an incident channel and output branches, is presented. The transitional guide is used to improve the mode field matching between both waves supported by the incident and output waveguides. Numerical simulations show that this geometry can minimize the junction loss to 0.041 dB at 1310 nm and 0.052 dB at 1550 nm wavelength, respectively. Silica samples based on the design are fabricated by PECVD. Determination shows that the samples exhibit very low junction loss of about 0.08 dB and 0.09 dB at the two wavelengths.

Citation Download Citation

Baoxue Chen, Yifang Yuan, and Mamoru Iso "New type of low-loss SiO₂ Y-branch waveguide", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408325

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