Paper
20 March 2001 SLM operating curves for statistical pattern recognition metrics
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Abstract
We show how the signal to noise ratio distributes ideally in the complex plane of filter values, and we show how it is captured in its representation on the restricted set of values the filter SLM is able to realize. The ability to take strong advantage of a large dynamic range of filter magnitude is apparent. Further work will extend this concept to other metrics of optical correlator performance, including statistical pattern recognition criterion functions such as Bayes' error, ROC (receiver operating characteristic) curve's area, and Fisher ratio.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard D. Juday, John Michael Rollins, and Stanley E. Monroe Jr. "SLM operating curves for statistical pattern recognition metrics", Proc. SPIE 4387, Optical Pattern Recognition XII, (20 March 2001); https://doi.org/10.1117/12.421149
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Cited by 2 scholarly publications.
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KEYWORDS
Spatial light modulators

Signal to noise ratio

Optical correlators

Optical filters

Electronic filtering

Optimal filtering

Pattern recognition

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