High-resolution Al203/B4C multilayers

Christian Morawe; Jean-Christophe Peffen; Eric Ziegler; Andreas K. Freund

doi:10.1117/12.448485

14 November 2001 High-resolution Al₂0₃/B₄C multilayers

Christian Morawe, Jean-Christophe Peffen, Eric Ziegler, Andreas K. Freund

Proceedings Volume 4501, X-Ray Mirrors, Crystals, and Multilayers; (2001) https://doi.org/10.1117/12.448485
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

To fill the gap in energy resolution dE/E between a few percent for multilayer x-ray optics and a few 10^-4 for perfect crystal optics we have developed narrow bandpass multilayers consisting of Al₂O₃ and B₄C layers. Their resolving power was precisely determined on the ESRF bending magnet beamline BM5 using a white beam and a Si(111) analyzer crystal. Scans in the (n,+m) and in the (n,-m) scattering geometry return consistent results. With a sample of 680 double layers we have obtained a spectral resolution of 0.27% at energies around 12 keV which is in good agreement with earlier studies using monochromatic x-rays.

Citation Download Citation

Christian Morawe, Jean-Christophe Peffen, Eric Ziegler, and Andreas K. Freund "High-resolution Al₂0₃/B₄C multilayers", Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); https://doi.org/10.1117/12.448485

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