Paper
18 December 2001 Multichannel fast hard x-ray spectrometer with spatial resolution capability for extended z-pinch plasma sources
Hank LeBeau, Dmitry A. Fedin, Victor L. Kantsyrev, Bruno S. Bauer, Sean Keely, A. Kessler, Wade Cline, Gene Newman
Author Affiliations +
Abstract
A multi-channel, fast, hard x-ray diode spectrometer is being developed at the Nevada Terawatt facility. This spectrometer helps facilitate the study of the time evolution of hard x-ray emissions from hot, dense plasma. Each channel in the array can be adjusted individually with shielded view areas, allowing small areas of an x-ray source to be isolated and studied by region. This spatial resolution capability will permit a better understanding of the mechanisms present in hot, dense plasma. Results will be presented of experimental tests, and their interpretation, pertaining to the hard x-ray emissions generated from an x-pinch source in a pulse-power type device.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hank LeBeau, Dmitry A. Fedin, Victor L. Kantsyrev, Bruno S. Bauer, Sean Keely, A. Kessler, Wade Cline, and Gene Newman "Multichannel fast hard x-ray spectrometer with spatial resolution capability for extended z-pinch plasma sources", Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); https://doi.org/10.1117/12.450764
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KEYWORDS
Spectroscopy

Diodes

Hard x-rays

Plasma

Spatial resolution

Optical filters

X-rays

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