Angle-resolved differential reflectance: technique for 0-90 degree incidence angle reflectance measurements

Antonio Parretta; Pasqualino Maddalena; Pierpasquale Tortora

doi:10.1117/12.530968

19 November 2003 Angle-resolved differential reflectance: technique for 0-90 degree incidence angle reflectance measurements

Antonio Parretta, Pasqualino Maddalena, Pierpasquale Tortora

Author Affiliations +

Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.530968
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

A new method is presented for measurements of angle-resolved reflectance of a plane surface. The main innovation introduced by the method consists in allowing to carry out reflectance measurements from 0° to 90° of incidence angle. This was obtained by changing the technique of sample illumination: instead of illuminating a portion of the test surface, the entire test surface is illuminated by a collimated and uniform beam at any angle of incidence. To be applied, the method requires, besides measurement on the unknown sample, also measurements on two different standards of diffuse reflectance. The method is particularly suitable for the optical characterization of photovoltaic devices, generally exposed to the inclined light of the direct component of solar radiation.

Citation Download Citation

Antonio Parretta, Pasqualino Maddalena, and Pierpasquale Tortora "Angle-resolved differential reflectance: technique for 0-90 degree incidence angle reflectance measurements", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.530968

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