Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control

Osami Sasaki; Kazuhiro Akiyama; Takamasa Suzuki

doi:10.1117/12.530947

19 November 2003 Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control

Osami Sasaki, Kazuhiro Akiyama, Takamasa Suzuki

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Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.530947
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

Phase modulation amplitude Z_b caused by a sinusoidal wavelength-scanning and conventional phase α of an interference signal are kept at π and 3π/2, respectively, with feedback control systems for a displacement of an object larger than a half-wavelength. A voltage applied to a device that provides the wavelength-scanning becomes a ruler marked out every a wavelength. Real-time distance measurement is carried out with this interferometer.

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Osami Sasaki, Kazuhiro Akiyama, and Takamasa Suzuki "Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.530947

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KEYWORDS

Feedback control

Interferometers

Distance measurement

Control systems

Feedback signals

Signal detection

Lanthanum

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