Variable resolution profilometer for artwork surface topography

Giuseppe Schirripa Spagnolo; Raffaele Majo; Dario Ambrosini; Domenica Paoletti

doi:10.1117/12.524910

19 November 2003 Variable resolution profilometer for artwork surface topography

Giuseppe Schirripa Spagnolo, Raffaele Majo, Dario Ambrosini, Domenica Paoletti

Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524910
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

We propose an optical method to evaluate deterioration mechanisms affecting cultural heritage materials. The method is based on a phase element, which forms interference fringes on the object. The surface topography is obtained by a phase shifting technique.

Citation Download Citation

Giuseppe Schirripa Spagnolo, Raffaele Majo, Dario Ambrosini, and Domenica Paoletti "Variable resolution profilometer for artwork surface topography", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.524910

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available