Applications of x-ray interferometry in metrology and phase-contrast imaging

Giovanni Mana

doi:10.1117/12.484565

29 July 2002 Applications of x-ray interferometry in metrology and phase-contrast imaging

Giovanni Mana

Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484565
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation

Abstract

X-ray interferometry makes important contributions in several fields, such as the improvement of a set of self-consistent fundamental physical constants, the linking between macroscopic and microscopic length scales, the metrology of atomicscale displacements, and the x-ray topography and tomography. This paper reviews x-ray interferomery by describing the principles of operation and the most important features of combined x-ray and optical interferometry, with emphasis on the scientific and technological challenges still deserving particular attention.

Citation Download Citation

Giovanni Mana "Applications of x-ray interferometry in metrology and phase-contrast imaging", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); https://doi.org/10.1117/12.484565

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