Paper
29 July 2002 New methods for analysis of interferograms in phase-shifting interferometry
V. I. Gushov, S. P. Iliynykh
Author Affiliations +
Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484528
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation
Abstract
The basic concepts in the application of new methods to interferogram analysis are introduced. Three ideas are underlined: first, way of obtaining decoding of the equations for the analysis of interferograms at arbitrary phase shifts, second, definition of actual values of phase shifts immediately from values of brightness of interferograms and third, method of a volume expansion at measurement of a phase difference of light waves.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. I. Gushov and S. P. Iliynykh "New methods for analysis of interferograms in phase-shifting interferometry", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); https://doi.org/10.1117/12.484528
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KEYWORDS
Phase shifts

Phase interferometry

Interferometry

Fringe analysis

Wavefronts

Error analysis

Information operations

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