Paper
16 May 2003 Modeling laser beam spatial separation effects for projection laser crystallization
Hidayat Kisdarjono, Apostolos T. Voutsas, Rajendra Solanki
Author Affiliations +
Abstract
A model for projection laser crystallization of thin silicon films has been developed. The model is capable of simulating stochastic nucleation and grain growth to predict the extent of lateral growth (LG) in the film and the details of the final microstructure. This model was used to simulate irradiation schemes involving multiple pulses, designed to increase the lateral growth length (LGL) in the irradiated domain. For an irradiation scheme involving two pulses, with an adjustable time delay, our simulation predicted a maximum increase in LGL of about 50% (from 2μm to 3μm) with a maximum film temperature of ~2700 K. For a three-pulse irradiation scheme (without time delay) a 50% increase in LGL was also predicted, but with a maximum film temperature of ~2200 K. These simulations show the efficacy and the relative merit of each of the examined schemes, as well as, their associated process window.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hidayat Kisdarjono, Apostolos T. Voutsas, and Rajendra Solanki "Modeling laser beam spatial separation effects for projection laser crystallization", Proc. SPIE 5004, Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas, (16 May 2003); https://doi.org/10.1117/12.482590
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Laser crystals

Crystals

Interfaces

Liquids

Silicon films

Monte Carlo methods

Solids

Back to Top