Paper
11 June 2003 Strongly modulated conduction in Ag/PLZT/LSCO ferroelectronic field-effect transistor
I. Grekhov, L. Delimova, I. Liniichuk, D. Mashovets, I. Veselovsky
Author Affiliations +
Abstract
A possibility of fabricating all-perovskite field effect transistor is shown, which can provide the development of a nonvolatile memory cell with a nondestructive readout of information. A thin (approximately 5 - 10 nm) Sr-doped lantanate cuprate (LSCO) film was used as a transistor channel while a ferroelectric gate insulator was a lead zirconate titanate (PLZT) film of about 100 nm thickness. The modulation of a channel conduction was found in the studied transistors to be approximately 70%, which is an order of magnitude larger than that reported in the world literature.
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I. Grekhov, L. Delimova, I. Liniichuk, D. Mashovets, and I. Veselovsky "Strongly modulated conduction in Ag/PLZT/LSCO ferroelectronic field-effect transistor", Proc. SPIE 5023, 10th International Symposium on Nanostructures: Physics and Technology, (11 June 2003); https://doi.org/10.1117/12.514253
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KEYWORDS
Modulation

Transistors

Field effect transistors

Resistance

Dielectric polarization

Crystals

Nondestructive evaluation

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