Optoelectronic method for noncontact reconstructing 3D objects surface profile of large sizes

Yury N. Kulchin; Vladimir P. Vasiliev; Yuri Yu. Nikonov

doi:10.1117/12.502158

17 June 2003 Optoelectronic method for noncontact reconstructing 3D objects surface profile of large sizes

Yury N. Kulchin, Vladimir P. Vasiliev, Yuri Yu. Nikonov

Proceedings Volume 5129, Fundamental Problems of Optoelectronics and Microelectronics; (2003) https://doi.org/10.1117/12.502158
Event: Fundamental Problems of Optoelectronics and Microelectronics, 2002, Vladivostok, Russian Federation

Abstract

Optoelectronic method for non-contact reconstructing surface profile of large size 3D objects is investigated in this paper. Optimal parameters for measuring are proposed. It is shown that the given method, as against known, does not require fine tuning of equipment. Numerical method for minimization of errors caused by aberrations distortions is proposed. The step-by-step cells method that allows increasing measurement accuracy.

Citation Download Citation

Yury N. Kulchin, Vladimir P. Vasiliev, and Yuri Yu. Nikonov "Optoelectronic method for noncontact reconstructing 3D objects surface profile of large sizes", Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); https://doi.org/10.1117/12.502158

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available