Paper
20 September 2004 Ultrafast spectroscopy and interferometry of laser-shocked thin films: practical considerations
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Abstract
Shaped femtosecond laser driven shock waves fulfill the requisite time resolution required for following shock induced chemical kinetics, and enable very small scale shock physics experimentation. However, comparison to large scale experiments requires detailed characterization of the generated pressure profile. Spectroscopic studies at pressure and temperature are hindered by fluctuations in shock strength as functions of space and time. Representative time resolved broadband infrared absorption data on shocked polyvinylnitrate thin films are presented, followed by current efforts to alleviate spatial shock strength variations with spatial pulse shaping, and calculations of the interferometric phase shifts expected at long times, during the rarefaction.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shawn D. McGrane, David S. Moore, and David J. Funk "Ultrafast spectroscopy and interferometry of laser-shocked thin films: practical considerations", Proc. SPIE 5448, High-Power Laser Ablation V, (20 September 2004); https://doi.org/10.1117/12.547966
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Cited by 5 scholarly publications.
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KEYWORDS
Thin films

Interferometry

Spectroscopy

Picosecond phenomena

Aluminum

Absorption

Infrared radiation

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