Far- and near-field characterization of a photonic-crystal-based microcavity on silicon-on-insulator

Benoit Cluzel; Davy Gerard; Emmanuel Picard; Thomas Charvolin; Vincent Calvo; Emmanuel Hadji; Frederique de Fornel

doi:10.1117/12.545764

15 September 2004 Far- and near-field characterization of a photonic-crystal-based microcavity on silicon-on-insulator

Benoit Cluzel, Davy Gerard, Emmanuel Picard, Thomas Charvolin, Vincent Calvo, Emmanuel Hadji, Frederique de Fornel

Proceedings Volume 5450, Photonic Crystal Materials and Nanostructures; (2004) https://doi.org/10.1117/12.545764
Event: Photonics Europe, 2004, Strasbourg, France

Abstract

We report the spectroscopic characterisation of an integrated microcavity designed for the 1.5μm telecommunication wavelength by using both near- and far-field techniques. We show the establishment of the cavity mode for wavelengths ranging from the photonic band gap to the resonance by using a scanning near-field optical microscope in collection mode. The respective contributions of out of plane losses and evanescent field are clearly identified. Transmission measurements on a broad spectral range are performed and results obtained by the two techniques are in very good agreement.

Citation Download Citation

Benoit Cluzel, Davy Gerard, Emmanuel Picard, Thomas Charvolin, Vincent Calvo, Emmanuel Hadji, and Frederique de Fornel "Far- and near-field characterization of a photonic-crystal-based microcavity on silicon-on-insulator", Proc. SPIE 5450, Photonic Crystal Materials and Nanostructures, (15 September 2004); https://doi.org/10.1117/12.545764

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