Lionel Aigouy,1 Michel Mortier,2 Yannick De Wilde,3 Jacques Gierak,4 Eric Bourhis4
1Ecole Superieure de Physique et de Chimie Industrielles, CNRS (France) 2Ecole Nationale Superieure de Chimie de Paris (France) 3Ecole Superieure de Physique et de Chimie Industrielles (France) 4LPN, CNRS (France)
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We have developed a local optical probe that uses a sub-wavelength rare-earth-doped glass-ceramic particle as a nanodetector of electromagnetic fields. These particles have the advantage of operating at room temperature with a very good photostability. Fluorescence emission occurs at several wavelengths and we detect the intense one located around 550 nm. The fluorescence responds non-linearly to the excitation. This induces a better sensitivity to strong optical fields, so to localized evanescent fields. We will first describe the probe fabrication procedure. This step is performed with a nanomanipulator which allows the deposition of an adhesive polymer at the extremity of an atomic force microscope tip and then the sticking of the particle at the end of the tip. A reduction of the particle size with a Focused Ion Beam (FIB) is also accomplished. We will then describe some experiments performed on various test samples which demonstrate a subwavelength optical resolution. In particular, the distribution of the electromagnetic field located around nano-holes (diameter 250 nm) in metal films has been imaged.
Lionel Aigouy,Michel Mortier,Yannick De Wilde,Jacques Gierak, andEric Bourhis
"Near-field optical measurements using rare-earth-doped glass-ceramic particles", Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); https://doi.org/10.1117/12.544106
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Lionel Aigouy, Michel Mortier, Yannick De Wilde, Jacques Gierak, Eric Bourhis, "Near-field optical measurements using rare-earth-doped glass-ceramic particles," Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); https://doi.org/10.1117/12.544106