Subnanometer level model validation of the SIM interferometer

Robert P. Korechoff; Daniel J. Hoppe; Xu Wang

doi:10.1117/12.550153

20 October 2004 Subnanometer level model validation of the SIM interferometer

Robert P. Korechoff, Daniel J. Hoppe, Xu Wang

Proceedings Volume 5491, New Frontiers in Stellar Interferometry; (2004) https://doi.org/10.1117/12.550153
Event: SPIE Astronomical Telescopes + Instrumentation, 2004, Glasgow, United Kingdom

Abstract

The Space Interferometer Mission (SIM) flight instrument will not undergo a full performance, end-to-end system test on the ground due to a number of constraints. Thus, analysis and physics-based models will play a significant role in providing confidence that SIM will meet its science goals on orbit. The various models themselves are validated against the experimental results of severl "picometer" testbeds. In this paper we describe a set of models that are used to predict the magnitude and functional form of a class of field-dependent systematic errors for the science and guide interferometers. This set of models is validated by comparing predictions with the experimental results obtained from the MicroArcsecond Metrology (MAM) testbed and the Diffraction testbed (DTB). The metric for validation is provided by the SIM astrometric error budget.

Citation Download Citation

Robert P. Korechoff, Daniel J. Hoppe, and Xu Wang "Subnanometer level model validation of the SIM interferometer", Proc. SPIE 5491, New Frontiers in Stellar Interferometry, (20 October 2004); https://doi.org/10.1117/12.550153

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