Paper
2 August 2004 Equivalence between the software-determined and the hardware-determined effective numerical aperture in the interferometrical measuring of microlens
Masahiko Kato, Takaaki Miyashita, Kenjiro Hamanaka, Satoshi Ishihara D.V.M., Eiichi Sato, Tadashi Morokuma
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Abstract
We describe here characteristic properties relating to the interferometrical measuring of microlens with an effective numerical aperture determined by the software or the hardware. Starting from the wave equation, both of the amplitude and the phase of propagating optical beams can be calculated using Hankel transformation anywhere through the interferometer. First introducing the effective aperture determined by the hardware including the method of projecting the effective aperture on the pupil of the microlens, the effect of truncation or diffraction with the effective aperture on the beam propagation is shown. Next using Mach-Zehnder interferometer combined with the effective aperture, the measurement of the wavefront aberration of test microlens is simulated to show that the imaginary aperture by the software settled on the image sensor which is located at the conjugate position of the test microlens is equivalent to the hardware determined effective aperture including projected one. Numerical results are presented to show the measurement errors stay within λ/100 for two typical test microlens of 38 μmΦ and 125 μmΦ with 1 λ wavefront aberration for aberration-free measuring optics with large enough numerical aperture.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masahiko Kato, Takaaki Miyashita, Kenjiro Hamanaka, Satoshi Ishihara D.V.M., Eiichi Sato, and Tadashi Morokuma "Equivalence between the software-determined and the hardware-determined effective numerical aperture in the interferometrical measuring of microlens", Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); https://doi.org/10.1117/12.559837
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Cited by 3 scholarly publications.
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KEYWORDS
Microlens

Wavefront aberrations

Image sensors

Interferometers

Interferometry

Objectives

Diffraction

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