Paper
13 April 2005 A two-dimensional drift-diffusion model of THz emission from n-GaAs and InAs surfaces in a magnetic field (Invited Paper)
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Abstract
We present a model of THz emission enhancement from femtosecond pulse excited n-GaAs and InAs surfaces with the application of a dc magnetic field. The far-field THz emission at different optical excitation densities, magnetic field strengths, and magnetic field orientations is determined. The model accurately describes the power dependence of THz emission from n-GaAs and InAs surfaces for magnetic field strengths up to ±10 T and ±6 T, respectively. THz emission saturation in both semiconductors for optical excitation densities from 40 nJ/cm2 to 2.2 μJ/cm2 are in accordance with previously reported experimental data. The model provides a useful tool for the description of ultra-fast processes in semiconductors.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth J. Chau and Abdul Y. Elezzabi "A two-dimensional drift-diffusion model of THz emission from n-GaAs and InAs surfaces in a magnetic field (Invited Paper)", Proc. SPIE 5725, Ultrafast Phenomena in Semiconductors and Nanostructure Materials IX, (13 April 2005); https://doi.org/10.1117/12.590643
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KEYWORDS
Terahertz radiation

Indium arsenide

Magnetism

Semiconductors

Magnetic semiconductors

Diffusion

Carrier dynamics

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