Paper
7 July 2005 Material parameter extraction for terahertz time-domain spectroscopy using fixed-point iteration
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Proceedings Volume 5840, Photonic Materials, Devices, and Applications; (2005) https://doi.org/10.1117/12.612946
Event: Microtechnologies for the New Millennium 2005, 2005, Sevilla, Spain
Abstract
A simple method to extract the far-infrared dielectric parameters of a homogeneous material from terahertz signals is explored in this paper. Provided with a reference, sample-probing terahertz signal and a known sample thickness, the method can determine the underlying complex refractive index of the sample within a few iterations based on the technique of fixed-point iteration. The iterative process is guaranteed to converge and gives the correct parameters when the material thickness exceeds 200 μm at a frequency of 0.1 THz or 20 μm at a frequency of 1.0 THz.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Withayachumnankul, B. Ferguson, T. Rainsford, S. P. Mickan, and D. Abbott "Material parameter extraction for terahertz time-domain spectroscopy using fixed-point iteration", Proc. SPIE 5840, Photonic Materials, Devices, and Applications, (7 July 2005); https://doi.org/10.1117/12.612946
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Cited by 36 scholarly publications.
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KEYWORDS
Terahertz radiation

Refractive index

Terahertz spectroscopy

Silicon

Semiconducting wafers

Interference (communication)

Signal processing

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