Noise limitation in nano-scale imaging

Mughees Khan; P. R. Hemmer

doi:10.1117/12.610986

23 May 2005 Noise limitation in nano-scale imaging

Mughees Khan, P. R. Hemmer

Proceedings Volume 5842, Fluctuations and Noise in Photonics and Quantum Optics III; (2005) https://doi.org/10.1117/12.610986
Event: SPIE Third International Symposium on Fluctuations and Noise, 2005, Austin, Texas, United States

Abstract

When imaging schemes such as Magnetic Resonance Imaging are applied to nano-scale samples, the practical resolution is often limited by noise due to the difficulty of detecting a signal from a small number of nuclear or electronic spins. In this paper we discuss the potential for improving resolution by using optically detected magnetic resonance imaging such as optical Raman excited ESR transitions. Comparisons will be made between magnetic field gradients vs ac Stark gradients and optical Raman vs. direct microwave spin excitations. To make the analysis more concrete we will use nitrogen-vacancy (NV) defect centers in diamond as a test system.

Citation Download Citation

Mughees Khan and P. R. Hemmer "Noise limitation in nano-scale imaging", Proc. SPIE 5842, Fluctuations and Noise in Photonics and Quantum Optics III, (23 May 2005); https://doi.org/10.1117/12.610986

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