Gaspar Rego,1,2 J. C. C. Carvalho,2 P. V. S. Marques,2,3 Alberto Fernandez Fernandez,4,5 F. Duerr,6 Hans G. Limberger6
1Instituto Politecnico de Viana do Castelo (Portugal) 2INESC Porto (Portugal) 3Univ. do Porto (Portugal) 4SCK-CEN Belgian Nuclear Research Ctr. (Belgium) 5Univ. Libre de Bruxelles (Belgium) 6Ecole Polytechnique Federale de Lausanne (Switzerland)
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Long-period gratings were written in a pure-silica-core fiber using the electric arc technique. To assess the influence of stress relaxation on grating formation, tomographic stress measurements were performed inside the grating. No stress annealing could be observed within the accuracy of the stress measurement, suggesting a negligible photo-elastic contribution to the arc-induced perturbation of the index profile. In contrast, stress relaxation was found inside a splice of pure-silica-core fiber where discharge conditions are different, indicating the general potential to alter the fibers stress and thus the index profile using an electric arc.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Gaspar Rego, J. C. C. Carvalho, P. V. S. Marques, Alberto Fernandez Fernandez, F. Duerr, Hans G. Limberger, "Stress profiling of arc-induced long-period gratings written in pure-silica-core fibers," Proc. SPIE 5855, 17th International Conference on Optical Fibre Sensors, (23 May 2005); https://doi.org/10.1117/12.624285