Restitution of the technological parameters of a 320×240 MCT LWIR focal plane array by spectrometric measurements

Sylvain Rommeluère; Nicolas Guérineau; Joël Deschamps; Eric De Borniol; Alain Million; Jean-Paul Chamonal; Gérard Destefanis

doi:10.1117/12.626301

14 October 2005 Restitution of the technological parameters of a 320×240 MCT LWIR focal plane array by spectrometric measurements

Sylvain Rommeluère, Nicolas Guérineau, Joël Deschamps, Eric De Borniol, Alain Million, Jean-Paul Chamonal, Gérard Destefanis

Author Affiliations +

Proceedings Volume 5964, Detectors and Associated Signal Processing II; 59640E (2005) https://doi.org/10.1117/12.626301
Event: Optical Systems Design 2005, 2005, Jena, Germany

Abstract

The evaluation of technological parameters is of primary importance for the detector industry, since it allows both to validate the fabrication process and to optimize the electro-optical characteristics of the detectors. By measuring the spectral response of detectors with a high resolution, it is possible to display specific optical effects. Using a radiometric model of the detecting architecture, we are able to understand their physical origins and to determinate some technological and optical parameters. We have developed a test bench which provides spectral responses of infrared detectors using a Fourier transform spectrometer. The principle of the test bench and the methodology used are detailed. Experimental results, as well as the associated radiometric model, are presented for a dedicated 320×240 MCT LWIR focal plane arrays (FPAs).

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Sylvain Rommeluère, Nicolas Guérineau, Joël Deschamps, Eric De Borniol, Alain Million, Jean-Paul Chamonal, and Gérard Destefanis "Restitution of the technological parameters of a 320×240 MCT LWIR focal plane array by spectrometric measurements", Proc. SPIE 5964, Detectors and Associated Signal Processing II, 59640E (14 October 2005); https://doi.org/10.1117/12.626301

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