Paper
19 October 2005 Development of a nanoscale linewidth-standard for high-resolution optical microscopy
Uwe Huebner, W. Morgenroth, R. Boucher, W. Mirandé, E. Buhr, Th. Fries, Nadine Schwarz, G. Kunath-Fandrei, R. Hild
Author Affiliations +
Abstract
We are developing a new linewidth standard on the nanometre scale for use in the recently introduced new high-resolution optical microscopy techniques like deep ultraviolet microscopy (UVM) and confocal laser scanning microscopy (CLSM). Different types of high-resolution gratings, etched in amorphous silicon on quartz substrates, have been fabricated and evaluated using state-of-the-art UVM, CLSM, REM and AFM equipment. The produced linewidths range from about 80 nm to 2 μm. The contrast of the pattern in the UV region makes them suitable for transmission and reflection UV and laser scanning microscopy.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Uwe Huebner, W. Morgenroth, R. Boucher, W. Mirandé, E. Buhr, Th. Fries, Nadine Schwarz, G. Kunath-Fandrei, and R. Hild "Development of a nanoscale linewidth-standard for high-resolution optical microscopy", Proc. SPIE 5965, Optical Fabrication, Testing, and Metrology II, 59651W (19 October 2005); https://doi.org/10.1117/12.625194
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Quartz

Silicon

Ultraviolet radiation

Amorphous silicon

Calibration

Microscopy

Optical microscopy

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