3D analysis of the dynamics of a metal-ferroelectric-semiconductor heterostructure

Cristina Stan; Bogdan Mereu; Constantin P. Cristescu; Alexandru Lupascu

doi:10.1117/12.639777

14 December 2005 3D analysis of the dynamics of a metal-ferroelectric-semiconductor heterostructure

Cristina Stan, Bogdan Mereu, Constantin P. Cristescu, Alexandru Lupascu

Proceedings Volume 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II; 59721D (2005) https://doi.org/10.1117/12.639777
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 2004, Bucharest, Romania

Abstract

A series RLC electric circuit with the metal-ferroelectric-semiconductor (MFS) heterwdructure playing the role of nonlinear capacity shows various nonlinear dynamics such as period doubling and Ruelle-Takens scenarios of evolution to chaos. Experimental investigations and preliminary theoretical analysis on the dynamics of this structure are considered. We mainly focus on a period-doubhng bifurcation evolution to chaos induced by the change in the amplitude of a sinusoidal driving with given frequency and by the change in the frequency of driving signal of fixed amplitude. In this paper we concentrate on an integrated image of these phenomena as reflected in 3D graphs of spectral analysis. A theoretical model of this MFS structure as nonlinear element of an electrical circuit based on a system of two coupled nonlinear Duffing oscillators is proposed. Numerical simulations for electrical variables in the circuit were performed both by specific methods of nonlinear investigations and by 3D plots representing Fourier power spectra as function of the frequency and the amplitude of the forcing as control parameters. The dynamics of the theoretical model are in reasonable agreement with the experimental results.

Citation Download Citation

Cristina Stan, Bogdan Mereu, Constantin P. Cristescu, and Alexandru Lupascu "3D analysis of the dynamics of a metal-ferroelectric-semiconductor heterostructure", Proc. SPIE 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 59721D (14 December 2005); https://doi.org/10.1117/12.639777

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