Paper
15 February 2006 Nanoscale coherent acoustic phonon imaging
Brian C. Daly, Julien Klein, Theodore B. Norris, Stanley Pau, Donald M. Tennant, Joseph A. Taylor, John E. Bower
Author Affiliations +
Abstract
An ultrafast optical pump and probe technique known as picosecond ultrasonics is used to generate and detect coherent acoustic phonon pulses in nanostructured films grown on Si wafers. By detecting the phonons after they have diffracted across a millimeter thick wafer, it is possible to measure the scattered phonons in the acoustic far field. Numerical backpropagation algorithms can then be used in order to reconstruct the object which scattered the acoustic phonon pulses. We describe measurements and simulations of experiments performed on surface and sub-surface nanostructures. Results with ~500 nm image resolution are shown, and plans for improving that resolution by an order of magnitude will be described.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian C. Daly, Julien Klein, Theodore B. Norris, Stanley Pau, Donald M. Tennant, Joseph A. Taylor, and John E. Bower "Nanoscale coherent acoustic phonon imaging", Proc. SPIE 6118, Ultrafast Phenomena in Semiconductors and Nanostructure Materials X, 61180U (15 February 2006); https://doi.org/10.1117/12.640367
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Cited by 1 scholarly publication.
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KEYWORDS
Acoustics

Phonons

Aluminum

Semiconducting wafers

Picosecond phenomena

Silicon

Coherence imaging

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