Paper
25 April 2006 Width of the apodization area in the case of diffractive optical elements with variable efficiency
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Abstract
We present simulations of averaged intensity of light behind apodized phase masks. Two types of apodization profile were assumed: Gaussian and tanh. In reality, because of limitations of electron-beam exposure system used for phase mask fabrication, we simulated phase masks with eight values of step height. For comparison, the averaged intensity distributions behind ideal phase masks with variable intensity were also calculated. Simulations and description of intensity distribution perturbations due to phase jumps in real apodized phase masks were performed.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tomasz Osuch, Zbigniew Jaroszewicz, and Andrzej Kołodziejczyk "Width of the apodization area in the case of diffractive optical elements with variable efficiency", Proc. SPIE 6187, Photon Management II, 61871G (25 April 2006); https://doi.org/10.1117/12.667280
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Cited by 3 scholarly publications.
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KEYWORDS
Apodization

Diffraction

Photomasks

Ultraviolet radiation

Fiber Bragg gratings

Diffractive optical elements

Phase shift keying

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