Resistor array waveband nonuniformity measurements and RNUC band converter

R. Bryan Sisko; Rhoe A. Thompson; Steven A. Marlow; Breck A. Sieglinger

doi:10.1117/12.669309

16 May 2006 Resistor array waveband nonuniformity measurements and RNUC band converter

R. Bryan Sisko, Rhoe A. Thompson, Steven A. Marlow, Breck A. Sieglinger

Proceedings Volume 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI; 62080Y (2006) https://doi.org/10.1117/12.669309
Event: Defense and Security Symposium, 2006, Orlando (Kissimmee), Florida, United States

Abstract

The nonuniformity correction (NUC) of a resistor array is typically performed with a high-grade infrared (IR) camera in the approximate waveband of a sensor under test (SUT). The array emitter outputs, and therefore the response nonuniformity, are a complicated function of the spectral band. In this paper, we study the performance obtained when measuring and NUCing the projector in one spectral band, then using the projector for testing in a different band. This is a practical necessity, since a test facility typically cannot own cameras for NUCing a projector in the wavebands of all test articles. We show that some aspects of the NUC can be reliably 'converted' or adjusted from one spectral band to another. But there are several different mechanisms that contribute to the response nonuniformity, and their dependence on the spectral band is different. We present several studies showing the results of measuring the nonuniformity in one band, and operating the projector in a different band.

Citation Download Citation

R. Bryan Sisko, Rhoe A. Thompson, Steven A. Marlow, and Breck A. Sieglinger "Resistor array waveband nonuniformity measurements and RNUC band converter", Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 62080Y (16 May 2006); https://doi.org/10.1117/12.669309

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