Paper
9 June 2006 Inverted SP resonance in palladium in Kretchmann configuration
P. Kohns, E. I. Logacheva, V. S. Makin, Yu. I. Pestov
Author Affiliations +
Proceedings Volume 6251, Lasers for Measurements and Information Transfer 2005; 625118 (2006) https://doi.org/10.1117/12.677895
Event: Lasers for Measurements and Information Transfer 2005, 2005, St. Petersburg, Russian Federation
Abstract
The surface plasmon resonance in Kretchmann configuration showing reflectivity maxima in thin palladium films has been discovered and investigated. The resonant curve form and angular position are influenced by thin film palladium whose properties (the frequency of nonelastic electron collisions in metal (γ) and the metal electron plasma frequency (ωp)) depend on concentration of hydrogen in ambient medium. It is shown that by increasing the γ value and decreasing the ωp value the resonant curve half-width broadens. Behavior of reflected beam phase as functions of γ and ωp was simulated. It is shown that inverted resonance for surface plasmons for palladium may be used for wide class of SP-based sensors, in particular, for sensors of small hydrogen concentration.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Kohns, E. I. Logacheva, V. S. Makin, and Yu. I. Pestov "Inverted SP resonance in palladium in Kretchmann configuration", Proc. SPIE 6251, Lasers for Measurements and Information Transfer 2005, 625118 (9 June 2006); https://doi.org/10.1117/12.677895
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KEYWORDS
Palladium

Metals

Plasma

Surface plasmons

Sensors

Hydrogen

Reflectivity

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