A measuring system for surface roughness parameters

Jinhong Han; Yunkai Wang; Xianfeng Zhang

doi:10.1117/12.716176

13 October 2006 A measuring system for surface roughness parameters

Jinhong Han, Yunkai Wang, Xianfeng Zhang

Proceedings Volume 6280, Third International Symposium on Precision Mechanical Measurements; 62801Z (2006) https://doi.org/10.1117/12.716176
Event: Third International Symposium on Precision Mechanical Measurements, 2006, Urumqi, China

Abstract

We designed a measurement and control system which can measure the surface roughness parameters with a Single Chip Micyoco (SCM) as its kernel. It uses an inductive transducer to pick up the data. The instrumental structure and the working principle are also introduced in this paper. The integrated hardware and software systems have been designed and improved. The prototype model was calibrated and the instrumental precision was analysed according to the measured data. In this system the surface roughness parameters can automatically be measured and controlled, such as data processing, determination of the reference line, disposal of the surface profile informations, display and print of the results etc.

Citation Download Citation

Jinhong Han, Yunkai Wang, and Xianfeng Zhang "A measuring system for surface roughness parameters", Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 62801Z (13 October 2006); https://doi.org/10.1117/12.716176

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