Substrate Throughprint In Low Scatter Mirrors

John J. Hizny

doi:10.1117/12.954515

15 January 1976 Substrate Throughprint In Low Scatter Mirrors

John J. Hizny

Proceedings Volume 0065, Design, Manufacture and Application of Metal Optics; (1976) https://doi.org/10.1117/12.954515
Event: 19th Annual Technical Symposium, 1975, San Diego, United States

Abstract

Data is presented which details investigations of substrate throughprint in low scatter nickel plated aluminum mirrors. Effects of fabrication procedures are examined. A novel method is described for photographically recording the visible light scattering of mirror surfaces at near specular angles. Application of the technique to quantitative scatter measurement is considered. Use of the test for inprocess inspection is described.

Citation Download Citation

John J. Hizny "Substrate Throughprint In Low Scatter Mirrors", Proc. SPIE 0065, Design, Manufacture and Application of Metal Optics, (15 January 1976); https://doi.org/10.1117/12.954515

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