Paper
13 March 2007 Validation of simulated point response of columnar phosphor screens
Aldo Badano, Iacovos S. Kyprianou, Katherine H. Tang, Anindita Saha
Author Affiliations +
Abstract
Typical methods to measure the resolution properties of x-ray detectors use slit or edge devices. However, complete models of imaging systems for system optimization require knowledge of the point-response function of the detector. In this paper, we report on the experimental methods developed for the validation of the point-response function of an indirect columnar CsI:Tl detector predicted by Monte Carlo using mantis. We describe simulation results that replicate experimental resolution measurements using edge and pinhole devices. The experimental setup consists of a high-resolution CCD camera with a 1-to-1fiber optic faceplate that allows measurements for different scintillation screens. The results of these experiments and simulations constitute a resource for the development and validation of the columnar models of phosphor screens proposed as part of previous work with mantis. We compare experimental high-resolution pinhole responses of two different CsI(Tl) screens to predictions from mantis. The simulated response matches reasonably well the measurements at normal and off-normal x-ray incidence angle when a realistic pinhole is used in the simulation geometry. Our results will be combined with results on Swank factors determined from Monte Carlo pulse-height spectra to provide a comprehensive validation of the phosphor models, therefore allowing their use for in silico system optimization.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aldo Badano, Iacovos S. Kyprianou, Katherine H. Tang, and Anindita Saha "Validation of simulated point response of columnar phosphor screens", Proc. SPIE 6510, Medical Imaging 2007: Physics of Medical Imaging, 65100Y (13 March 2007); https://doi.org/10.1117/12.709686
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Cited by 1 scholarly publication.
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KEYWORDS
Monte Carlo methods

Sensors

X-rays

Imaging systems

Systems modeling

X-ray detectors

CCD cameras

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