Paper
12 December 2007 Automated chip-on-carrier screening of a SOA integrated full band tunable laser (DSDBR)
Chao Wang, George Dimitropoulos, Andrew J. Ward, Guoyuan Yang, Xuming Wu
Author Affiliations +
Proceedings Volume 6782, Optoelectronic Materials and Devices II; 67821D (2007) https://doi.org/10.1117/12.745723
Event: Asia-Pacific Optical Communications, 2007, Wuhan, China
Abstract
Chip-on-carrier (CoC) sub-assemblies of Digital Ssupermode DBR (DSDBR) lasers are produced in high volume within Bookham manufacturing plants. These lasers can cover more than 100 ITU channels with a 50GHz channel range across the C or L band with a minimum 13dBm output power and 40dB side mode suppression ratio (SMSR). To guarantee a high quality and ensure a good yield, an automated screening process has been put in place at the CoC level to eliminate poor devices. Typical tuning maps and key performance features of the device are shown in this paper. We describe the general features of the tuning map, and indicate how a suitable operating point can be determined. The use of automated test kit is also described in this article. Finally, the performance of our device is presented in detail.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chao Wang, George Dimitropoulos, Andrew J. Ward, Guoyuan Yang, and Xuming Wu "Automated chip-on-carrier screening of a SOA integrated full band tunable laser (DSDBR)", Proc. SPIE 6782, Optoelectronic Materials and Devices II, 67821D (12 December 2007); https://doi.org/10.1117/12.745723
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KEYWORDS
Tunable lasers

Manufacturing

Semiconducting wafers

Reflectors

Robot vision

Channel projecting optics

L band

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