Equipment for 2D profile measuring of aspheric microscope condenser in mass production

Xuemin Cheng; Jianshe Ma; Yi Zhang

doi:10.1117/12.757713

28 November 2007 Equipment for 2D profile measuring of aspheric microscope condenser in mass production

Xuemin Cheng, Jianshe Ma, Yi Zhang

Proceedings Volume 6834, Optical Design and Testing III; 68343L (2007) https://doi.org/10.1117/12.757713
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

This paper deals with the measurement of aspherics on surfaces of microscope condenser in mass production. The aspheric surface in microscope condenser is a kind of optical surface working under very large numerical aperture and small field of view. To fulfill Kohler illumination for the microscope condenser, the aspheric surface must be fabricated as well as designed capable of projecting an image of the source, large enough to fill the sub stage condenser of the microscope. For larger numerical aperture condenser fabrication, it is crucial to guarantee a reasonable aspheric profile for spherical aberration compensation and even illumination. Here we established the equipment for microscope condenser aspheric profile measuring in mass production. The industry microscope is reconstructed to image the profile, with LED panel light source for even backlighting. The profile, captured with a high resolution CCD, is processed. It can be compared with theoretic aspheric profile directly or interpolated with a predefined polynomial. In this method, supports for aspheric lens fabrication and measurement are designed and employed on the industry microscope. It guaranteed that a table of points can accurately describe the profile of the aspheric surface, introducing less assembling error. Measurement with this method has proved satisfactory for certain high aperture microscope condenser at low cost. For systems requiring still higher accuracy, the CCD resolution may have to be increased and interpolation method optimized accordingly but the online aspheric testing equipment with proper supports could surely improve the accuracy of aspheric surface fabrication at low cost.

Citation Download Citation

Xuemin Cheng, Jianshe Ma, and Yi Zhang "Equipment for 2D profile measuring of aspheric microscope condenser in mass production", Proc. SPIE 6834, Optical Design and Testing III, 68343L (28 November 2007); https://doi.org/10.1117/12.757713

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Aspheric lenses

Microscopes

Charge-coupled devices

Monochromatic aberrations

Light sources

Diamond turning

Light emitting diodes

Show All Keywords

Keywords/Phrases

Search In:

Publication Years