A Slitless, Intensified Readout, Gated Spectrometer: Wavelength And Efficiency Calibration, Time Response Characterization

Michel Gerassimenko; Mark C. Fowler

doi:10.1117/12.936565

12 August 1986 A Slitless, Intensified Readout, Gated Spectrometer: Wavelength And Efficiency Calibration, Time Response Characterization

Michel Gerassimenko, Mark C. Fowler

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Proceedings Volume 0689, X-Ray Calibration: Techniques, Sources, and Detectors; (1986) https://doi.org/10.1117/12.936565
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A spectrometer has been developed specifically for the x-ray laser effort at Lawrence Livermore National Laboratory (LLNL). The instrument takes advantage of the small divergence and size of the lasing source by positioning all three components - the source, a custom-ruled grating, and a microchannel plate (MCP) detector - on the Rowland circle. The sum of incident and diffracted angles is kept constant. Illuminating a pinhole at the source location with a z-pinch produces wavelength calibration at several energy ranges in the 65- to 200-eV interval. The same source used in conjunction with the MCP camera and Kodak 101 film yields the absolute detector efficiency. Ion bombardment of a beryllium target at the source location produces the x-rays necessary to determine the absolute efficiency of the grating-detector combination at 107 eV. Grating efficiency is then deduced from the MCP efficiency at that energy. Three 25-Ω stripline structures on the MCP allow sub-nanosecond gating of the spectrometer, which improves the signal-to-background ratio. The rise time response of the entire MCP detector-cable assembly is about 200 ps. We also measured the transmission of the filters that are used in suppressing ultraviolet backgrounds.

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Michel Gerassimenko and Mark C. Fowler "A Slitless, Intensified Readout, Gated Spectrometer: Wavelength And Efficiency Calibration, Time Response Characterization", Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); https://doi.org/10.1117/12.936565

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KEYWORDS

Microchannel plates

Cameras

Sensors

Calibration

Spectroscopy

Picosecond phenomena

Optical filters

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