Range-gated metrology: an ultra-compact sensor for dimensional stabilization

Oliver P. Lay; Serge Dubovitsky; Daniel A. Shaddock; Brent Ware; Christopher S. Woodruff

doi:10.1117/12.789437

23 July 2008 Range-gated metrology: an ultra-compact sensor for dimensional stabilization

Oliver P. Lay, Serge Dubovitsky, Daniel A. Shaddock, Brent Ware, Christopher S. Woodruff

Proceedings Volume 7018, Advanced Optical and Mechanical Technologies in Telescopes and Instrumentation; 70181A (2008) https://doi.org/10.1117/12.789437
Event: SPIE Astronomical Telescopes + Instrumentation, 2008, Marseille, France

Abstract

Point-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. Existing sensors are large and intrusive, however, with optical heads that consist of several optical elements and require multiple optical fiber connections. The use of point-to-point laser metrology has therefore been limited to applications where only a few gauges are needed and there is sufficient space to accommodate them. Range-Gated Metrology is a signal processing technique that preserves nanometer-level or better performance while enabling: (1) a greatly simplified optical head - a single fiber optic collimator - that can be made very compact, and (2) a single optical fiber connection that is readily multiplexed. This combination of features means that it will be straightforward and cost-effective to embed tens or hundreds of compact metrology gauges to stabilize a large structure. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed.

Citation Download Citation

Oliver P. Lay, Serge Dubovitsky, Daniel A. Shaddock, Brent Ware, and Christopher S. Woodruff "Range-gated metrology: an ultra-compact sensor for dimensional stabilization", Proc. SPIE 7018, Advanced Optical and Mechanical Technologies in Telescopes and Instrumentation, 70181A (23 July 2008); https://doi.org/10.1117/12.789437

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Head

Metrology

Signal processing

Sensors

Laser metrology

Multiplexing

Optical fibers

Show All Keywords

Keywords/Phrases

Search In:

Publication Years