Deep level defect structure of SiC material by local cluster neural network

Tomasz Pichlak; Stanislaw Jankowski

doi:10.1117/12.817929

6 November 2008 Deep level defect structure of SiC material by local cluster neural network

Tomasz Pichlak, Stanislaw Jankowski

Proceedings Volume 7124, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2008; 712402 (2008) https://doi.org/10.1117/12.817929
Event: Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2008, 2008, Wilga, Poland

Abstract

Main goal of presented work was the construction of neural network for detection of deep defect centers in semiinsulating materials. The element of novelty is the implementation of local cluster function combined with the leave-one-out method, used to determine the appropriate structure of neural net.

Citation Download Citation

Tomasz Pichlak and Stanislaw Jankowski "Deep level defect structure of SiC material by local cluster neural network", Proc. SPIE 7124, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2008, 712402 (6 November 2008); https://doi.org/10.1117/12.817929

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