Reliability of single-mode and multi-mode high-power semiconductor lasers at eye-safe wavelengths

T. Stakelon; J. Lucas; M. Osowski; R. Lammert; S. Moon; C. Panja; V. Elarde; K. Gallup; W. Hu; J. Ungar

doi:10.1117/12.807881

23 February 2009 Reliability of single-mode and multi-mode high-power semiconductor lasers at eye-safe wavelengths

T. Stakelon, J. Lucas, M. Osowski, R. Lammert, S. Moon, C. Panja, V. Elarde, K. Gallup, W. Hu, J. Ungar

Proceedings Volume 7198, High-Power Diode Laser Technology and Applications VII; 719819 (2009) https://doi.org/10.1117/12.807881
Event: SPIE LASE: Lasers and Applications in Science and Engineering, 2009, San Jose, California, United States

Abstract

High power semiconductor lasers with wavelengths in the eye-safer region have application to a variety of defense, medical and industrial applications. We report on the reliability of high power multimode and single mode InGaAsP/InP diode lasers with wavelengths in the range 1320 to 1550 nm in a variety of configurations, including single-chip, conduction-cooled arrays, arrays incorporating internal diffraction gratings, master-oscillator power amplifiers, and fiber-coupled modules of the above. In all cases we show very low rates of degradation in optical power and the absence of sudden failure from catastrophic optical damage or from laser-package interactions.

Citation Download Citation

T. Stakelon, J. Lucas, M. Osowski, R. Lammert, S. Moon, C. Panja, V. Elarde, K. Gallup, W. Hu, and J. Ungar "Reliability of single-mode and multi-mode high-power semiconductor lasers at eye-safe wavelengths", Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 719819 (23 February 2009); https://doi.org/10.1117/12.807881

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