Spatial elliptical polariscope for polarization distribution measurements

Wladyslaw A. Wozniak; Slawomir Drobczynski; Piotr Kurzynowski

doi:10.1117/12.827505

17 June 2009 Spatial elliptical polariscope for polarization distribution measurements

Wladyslaw A. Wozniak, Slawomir Drobczynski, Piotr Kurzynowski

Proceedings Volume 7390, Modeling Aspects in Optical Metrology II; 739009 (2009) https://doi.org/10.1117/12.827505
Event: SPIE Europe Optical Metrology, 2009, Munich, Germany

Abstract

We propose a new setup established to measure the light polarization state and the birefringent media parameters. This setup consists of two pairs of the linear Wollaston compensators and special circular compensators which form a set of two spatially modulated elliptical compensators. These compensators can be used separately as a spatial generator of all polarization states and as an elliptical spatial analyzer. When analyzing the light polarization state the singular minimum points in the output light intensity appear. The coordinates of these points depend linearly on the azimuth and ellipticity angles of the examined light. When combining both elements (generator and compensator) we can obtain a special spatial elliptical polariscope. It allows measuring the main birefringent media parameters: the azimuth and the ellipticity angle of its both eigenvectors as well as the phase difference, introduced by this medium. All desired quantities could be obtained by some simple intensity measurements and neither movable parts nor active elements are needed and no complicated analysis of output light should be made. We propose also a modification of described setup by using different shearing angles in Wollaston compensators used in generator and analyzer. This should allow using Fourier analysis of the output intensity distribution and makes our devices more suitable to real time measurements.

Citation Download Citation

Wladyslaw A. Wozniak, Slawomir Drobczynski, and Piotr Kurzynowski "Spatial elliptical polariscope for polarization distribution measurements", Proc. SPIE 7390, Modeling Aspects in Optical Metrology II, 739009 (17 June 2009); https://doi.org/10.1117/12.827505

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
10 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Polarization

Wave plates

CCD cameras

Modulation

Optical testing

Photonic integrated circuits

Phase shifts

Show All Keywords

Keywords/Phrases

Search In:

Publication Years