Paper
17 September 2009 Design and modeling of a lateral a-Se MSM photoconductor as indirect conversion X-ray imager
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Abstract
Amorphous selenium (a-Se) has been widely used as a direct conversion X-ray detection material. Vertical structures are employed in most cases, where >200 μm thick a-Se photoconductor layer is inserted between top and bottom electrodes. In this paper, we design a lateral metal-semiconductor-metal (MSM) structure in which a relatively thin layer of a-Se (~ 8 μm) is coated on top of two lateral electrodes. The simulation results indicate that dark current of such a structure stays extremely low level and external quantum efficiency (EQE) reaches over 30% with wavelengths ranging from 320 to 680 nm. We further fabricate the lateral MSM photoconductor by a two-mask photolithography process. The fabricated photoconductor exhibits a dark current below 40 fA under electric fields ranging from 6 V/μm to 9 V/μm, a responsivity up to 0.06 A/W, a measured EQE of 18% towards a short wavelength of 468 nm, and a high photoresponse speed at 500 Hz with a rise time of 250 μs, fall time of 350 μs, and time constant of 250 μs, respectively. Furthermore, an architecture of indirect conversion X-ray imager is proposed with the use of such a lateral MSM structure and a blue-emitting scintillator material atop.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kai Wang, Feng Chen, George Belev, Safa O. Kasap, and Karim S. Karim "Design and modeling of a lateral a-Se MSM photoconductor as indirect conversion X-ray imager", Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74491W (17 September 2009); https://doi.org/10.1117/12.829299
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Photodetectors

External quantum efficiency

Photoresistors

X-ray imaging

Sensors

Electrodes

Scintillators

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