Paper
21 October 2009 Modeling of the nonlinearity in nano-displacement measuring system based on the neural network approaches
Saeed Olyaee, Reza Ebrahimpour, Samaneh Hamedi, Farzad M. Jafarlou
Author Affiliations +
Abstract
Periodic nonlinearity is the main limitation on the accuracy of the nano-displacement measurements in the heterodyne interferometers. It is mainly produced by non-ideal polarized beams of the leaser and imperfect alignment of the optical components. In this paper, we model the periodic nonlinearity resulting from non-orthogonality and ellipticity of the laser beam by using combination of neural networks such as stacked generalization method and mixture of experts. The ensemble neural networks used for nonlinearity modeling are compared with single neural networks such as multi layer percepterons and radial basis function.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Saeed Olyaee, Reza Ebrahimpour, Samaneh Hamedi, and Farzad M. Jafarlou "Modeling of the nonlinearity in nano-displacement measuring system based on the neural network approaches", Proc. SPIE 7515, Photonics and Optoelectronics Meetings (POEM) 2009: Industry Lasers and Applications, 75150H (21 October 2009); https://doi.org/10.1117/12.846348
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Neural networks

Interferometers

Heterodyning

Error analysis

Beam splitters

Avalanche photodiodes

Laser sources

Back to Top