Paper
14 April 2010 Measurement of defect thickness of the wall thinning defect pipes by lock-in infrared thermography technique
Kyeongsuk Kim, Kyungsu Kim, Hyunchul Jung, Hosub Chang
Author Affiliations +
Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 75224Z (2010) https://doi.org/10.1117/12.851595
Event: Fourth International Conference on Experimental Mechanics, 2009, Singapore, Singapore
Abstract
Mostly piping which is using for the nuclear power plants are made up of carbon steel pipes. The wall thinning defects occurs by the effect of the flow accelerated corrosion of fluid that flows in carbon steel pipes. The defects could be found on the welding part and anywhere in the pipes. The infrared thermography technique which is one of the non-destructive testing method has used for detecting the defects of various kinds of materials over the years. There is a limitation for measuring the defect of metals that have a big coefficient of thermal diffusion. However, a technique using lock-in method gets over the difficulty. Consequently, the lock-in infrared thermography technique has been applied to the various industry fields. In this paper, the defect thickness of the straight pipe which has an artificial defect the inside of the pipes was measured by using the lock-in infrared thermography technique and the result could be utilized in detecting defects of carbon steel pipes.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kyeongsuk Kim, Kyungsu Kim, Hyunchul Jung, and Hosub Chang "Measurement of defect thickness of the wall thinning defect pipes by lock-in infrared thermography technique", Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75224Z (14 April 2010); https://doi.org/10.1117/12.851595
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Cited by 4 scholarly publications and 1 patent.
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KEYWORDS
Thermography

Diffusion

Defect detection

Carbon

Temperature metrology

Nondestructive evaluation

Corrosion

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