Phase unwrapping work of photoelastic stress analysis

M. J. Huang; P. C. Sung; H. L. An

doi:10.1117/12.851550

14 April 2010 Phase unwrapping work of photoelastic stress analysis

M. J. Huang, P. C. Sung, H. L. An

Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 752253 (2010) https://doi.org/10.1117/12.851550
Event: Fourth International Conference on Experimental Mechanics, 2009, Singapore, Singapore

Abstract

π Photoelasticity plays an important role in the field of stress analysis. Not only because it is a non-contact whole field optical method, but it provides isoclinic (principal stress direction) and isochomatic (principal stress difference) data as well, which serve as the two most important parameters in the field. But, unfortunately, the coupling between these two parameters induces phase ambiguity problem in the isochromatic data unless the isoclinic data have been correctly procured first. In this paper, a novel spatial phase unwrapping is first applied for retrieving the correct isoclinic data, which is then substituted into the isochromatic calculation to solve the 2 ambiguity problem conducted by wrapped isoclinic data. The result is checked with that from the theoretical analysis and shown to be with limited error. The same problem is solved in a different way - by the temporal approaches, load stepping or multiple wavelengths sourcing in advance. The intercomparison depicts that the spatial approach is more noise-immune than the temporal approach is. It is because that by the spatial approach the algorithm can check data not only of themselves but consult data also from their neighbors. As a result, any small localized error can be eliminated accordingly.

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M. J. Huang, P. C. Sung, and H. L. An "Phase unwrapping work of photoelastic stress analysis", Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 752253 (14 April 2010); https://doi.org/10.1117/12.851550

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KEYWORDS

Photoelasticity

Phase shifting

Stress analysis

Ranging

Bismuth

Charge-coupled devices

Data modeling

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