Optical design of a snapshot high-sampling image mapping spectrometer (IMS) for hyperspectral microscopy

Liang Gao; Robert Kester; Tomasz Tkaczyk

doi:10.1117/12.842686

26 February 2010 Optical design of a snapshot high-sampling image mapping spectrometer (IMS) for hyperspectral microscopy

Liang Gao, Robert Kester, Tomasz Tkaczyk

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Proceedings Volume 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII; 75700Z (2010) https://doi.org/10.1117/12.842686
Event: SPIE BiOS, 2010, San Francisco, California, United States

Abstract

A snapshot high-sampling Image Mapping Spectrometer (IMS) is developed for hyperspectral microscopy, measuring datacube of dimensions 285x285x60 (x, y, λ). Microscopy IMS is designed to work at the Nyquist sampling limit to realize high resolution imaging. The spatial resolution is ~0.45μm with FOV ~130μm. The spectral working range is 500-700nm with ~8.3nm average spectral resolution. Preliminary tests have been implemented on its imaging performances.

Citation Download Citation

Liang Gao, Robert Kester, and Tomasz Tkaczyk "Optical design of a snapshot high-sampling image mapping spectrometer (IMS) for hyperspectral microscopy", Proc. SPIE 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 75700Z (26 February 2010); https://doi.org/10.1117/12.842686

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