Absolute realization of low BRDF value

Zilong Liu; Ningfang Liao; Ping Li; Yu Wang

doi:10.1117/12.864900

11 October 2010 Absolute realization of low BRDF value

Zilong Liu, Ningfang Liao, Ping Li, Yu Wang

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76562J (2010) https://doi.org/10.1117/12.864900
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

Low BRDF value is widespread used in many critical domains such as space and military fairs. These values below 0.1 Sr^-1 . So the Absolute realization of these value is the most critical issue in the absolute measurement of BRDF. To develop the Absolute value realization theory of BRDF , defining an arithmetic operators of BRDF , achieving an absolute measurement Eq. of BRDF based on radiance. This is a new theory method to solve the realization problem of low BRDF value. This theory method is realized on a self-designed common double orientation structure in space. By designing an adding structure to extend the range of the measurement system and a control and processing software, Absolute realization of low BRDF value is achieved. A material of low BRDF value is measured in this measurement system and the spectral BRDF value are showed within different angles allover the space. All these values are below 0.4 Sr^-1 . This process is a representative procedure about the measurement of low BRDF value. A corresponding uncertainty analysis of this measurement data is given depend on the new theory of absolute realization and the performance of the measurement system. The relative expand uncertainty of the measurement data is 0.078. This uncertainty analysis is suitable for all measurements using the new theory of absolute realization and the corresponding measurement system.

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Zilong Liu, Ningfang Liao, Ping Li, and Yu Wang "Absolute realization of low BRDF value", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76562J (11 October 2010); https://doi.org/10.1117/12.864900

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KEYWORDS

Bidirectional reflectance transmission function

Uncertainty analysis

Sensors

Lamps

Metrology

Xenon

Light sources

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