Sensitivity analysis of an assembled Fourier transform microspectrometer

Jeongsik Sin; Woo Ho Lee; Harry E. Stephanou

doi:10.1117/12.850800

27 April 2010 Sensitivity analysis of an assembled Fourier transform microspectrometer

Jeongsik Sin, Woo Ho Lee, Harry E. Stephanou

Proceedings Volume 7680, Next-Generation Spectroscopic Technologies III; 76800T (2010) https://doi.org/10.1117/12.850800
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

This paper presents the statistical formulation of misalignments of optical components. As a case study, sensitivity analysis is performed to evaluate the optical performance of an assembled Fourier Transform (FT) microspectrometer. Precision alignment of optical components is a critical factor to achieve high sensitive measurement. Positional and angular misalignments of optical components are propagated and accumulated from one part to another as the beam is delivered. Optical paths are modeled as kinematic variables of a linked chain, and its propagation is calculated using forward kinematics with homogeneous transform matrices. This approach not only formulates the deviation of beam paths as traditional optics do, but also accommodates statistical variables to represent the mean and variance of kinematic errors. With the assumption of Gaussian distribution of the errors, the statistical equation was linearly propagated. The beam deviation was further combined with a light coupling model at the detector to evaluate the degradation of optical. Its prototype and experimental results were also reported.

Citation Download Citation

Jeongsik Sin, Woo Ho Lee, and Harry E. Stephanou "Sensitivity analysis of an assembled Fourier transform microspectrometer", Proc. SPIE 7680, Next-Generation Spectroscopic Technologies III, 76800T (27 April 2010); https://doi.org/10.1117/12.850800

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