Populating multi-fiber fiberoptic connectors using an interferometric measurement of fiber tip position and facet quality

Jurgen Van Erps; Anna Pakula; Slawomir Tomczewski; Michael Vervaeke; Leszek Salbut; Hugo Thienpont

doi:10.1117/12.853644

13 May 2010 Populating multi-fiber fiberoptic connectors using an interferometric measurement of fiber tip position and facet quality

Jurgen Van Erps, Anna Pakula, Slawomir Tomczewski, Michael Vervaeke, Leszek Salbut, Hugo Thienpont

Author Affiliations +

Proceedings Volume 7716, Micro-Optics 2010; 77161I (2010) https://doi.org/10.1117/12.853644
Event: SPIE Photonics Europe, 2010, Brussels, Belgium

Abstract

One of the most important challenges in multiple-fiber connectors is to achieve accurate fiber positioning, i.e. to ensure that the fiber end facets coincide with the front facet of the connector plate. Therefore, it is crucial to increase the accuracy of the assembly process of fiber connectors. We present the population of a plastic multi-fiber connector designed for optical interconnect applications with silica fiber, with a good uniformity of fiber protrusion across the array of ±2.5-μm. To this end, an interferometric setup for in situ monitoring of fiber tip positions during the insertion phase was developed. It ensures an accurate fiber tip position at the fiber connector's front facet and across the fiber array in cases where post-insertion polishing is not possible. Furhermore, our setup can provide us with insight into the influence of the curing process (e.g. shrinkage) on the tip position during the fiber fixation step and allows us to assess the fiber facet quality. We compare the fiber tip position measured in situ using our setup with the position measured off-line using a commercial white light interferometer, showing a deviation smaller than 5%.

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Jurgen Van Erps, Anna Pakula, Slawomir Tomczewski, Michael Vervaeke, Leszek Salbut, and Hugo Thienpont "Populating multi-fiber fiberoptic connectors using an interferometric measurement of fiber tip position and facet quality", Proc. SPIE 7716, Micro-Optics 2010, 77161I (13 May 2010); https://doi.org/10.1117/12.853644

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KEYWORDS

Connectors

Interferometers

Interferometry

Detection and tracking algorithms

In situ metrology

Optical fibers

Polymethylmethacrylate

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