Spectral transmittance and reflectance measurements utilizing a DLP based spectral source

Alexandre Y. Fong

doi:10.1117/12.877087

11 February 2011 Spectral transmittance and reflectance measurements utilizing a DLP based spectral source

Alexandre Y. Fong

Proceedings Volume 7932, Emerging Digital Micromirror Device Based Systems and Applications III; 79320J (2011) https://doi.org/10.1117/12.877087
Event: SPIE MOEMS-MEMS, 2011, San Francisco, California, United States

Abstract

Spectral transmission and reflectance are critical parameters for the evaluation of pigments, textiles and coatings on a number of product surfaces, including active displays. In this paper, we evaluate the usage of a DLP®- based spectral source as a tool in such observations noting its advantages not only in synthesizing individual band-passes but also full continua present in nature. We discuss how such capabilities are advantages for determining product effectiveness in conditions of real world usage as well as its limitations and future objectives.

Citation Download Citation

Alexandre Y. Fong "Spectral transmittance and reflectance measurements utilizing a DLP based spectral source", Proc. SPIE 7932, Emerging Digital Micromirror Device Based Systems and Applications III, 79320J (11 February 2011); https://doi.org/10.1117/12.877087

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